| 标题 |
Scanning photocurrent microscopy: A new technique to study inhomogeneously distributed recombination centers in semiconductors |
| 网址 | |
| DOI | |
| 其它 |
期刊:Solid-state Electronics 作者:D. Lang; C. Henry 出版日期:1978-11-01 |
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(2025-6-4)