| 标题 |
Characterization of Defects in the Expanded Area of Large-Size 8 Inch 4H-Sic Single Crystal Substrates |
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| DOI | |
| 其它 |
期刊:2024 21st China International Forum on Solid State Lighting & 2024 10th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS) 作者:Jiaxin Zhang; Xiufang Chen; Xianglong Yang; Yan Peng; Xuejian Xie; et al 出版日期:2025-01-17 |
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(2025-6-4)