| 标题 |
A Robust Defect Detection Method for Vision-Based Measurement System via Wavelet-Guided Spatial–Frequency Prior Network |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Instrumentation and Measurement 作者:Zhitao Wen; Jinhai Liu; Jianhua Tang; He Zhao; Lin Jiang; Qiannan Wang 出版日期:2025-12-12 |
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(2025-6-4)