| 标题 |
A review in thermal management for advanced chip packaging from chip to heat sink |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Min Soo Kim; Jaehyun Kim; Woosung Park; Joon Sang Kang 出版日期:2025-05-11 |
| 求助人 | |
| 下载 |
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(2025-6-4)