| 标题 |
Evaluation of the accuracy of stopping and range of ions in matter simulations through secondary ion mass spectrometry and Rutherford backscattering spectrometry for low energy heavy ion implantation |
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| DOI | |
| 其它 |
期刊:Journal of vacuum science & technology 作者:Michael Titze; Jose L Pacheco; Todd A. Byers; Stuart B. Van Deusen; Daniel Perry; et al 出版日期:2021-11-12 |
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(2025-6-4)