| 标题 |
A Reconfigurable Built-In Self-Test Scheme for the Evaluation Circuits of Digital SRAM-IMC Architectures |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Very Large Scale Integration (VLSI) Systems 作者:Sunrui Zhang; Xiaole Cui; Feng Wei; Xing Zhang 出版日期:2026 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)