| 标题 |
Study of wafer warpage for Fan-Out wafer level packaging: finite element modelling and experimental validation |
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| 其它 |
期刊:2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) 作者:A. Salahouelhadj; M. Gonzalez; K. Vanstreels; A. Podpod; A. Phommahaxay; et al 出版日期:2019-03-01 |
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(2025-6-4)