| 标题 |
Structural investigation of nanovoids around the interface of micro-vias by spherical aberration corrected scanning transmission electron microscopy |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:M.C. Hsieh; M. Nishijima; K. Jogo; Z. Zhang; R. Okumuara; et al 出版日期:2023 |
| 求助人 | |
| 下载 |
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(2025-6-4)