| 标题 |
Artificial neural network and acoustic emission-based fault diagnosis for wide temperature range silicon carbide MOSFET application |
| 网址 | |
| DOI | |
| 其它 |
期刊:Semiconductor Science and Technology 作者:Ruby Beniwal; Shruti Kalra 出版日期:2026 |
| 求助人 | |
| 下载 |
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(2025-6-4)