| 标题 |
Source-position-dependent transmission cross coefficient formula including polarization and mask three-dimensional effects in high-numerical-aperture extreme ultraviolet lithography |
| 网址 | |
| DOI |
10.1117/1.jmm.25.3.031604
doi
|
| 其它 |
期刊:Journal of Micro/Nanopatterning, Materials, and Metrology 作者:Hiroyoshi Tanabe; Moe Sugiyama; Masayuki Shimoda; Atsushi Takahashi 出版日期:2026-05-04 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
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(2025-6-4)