| 标题 |
Dual-element substitution induced integrated defect structure to suppress voltage decay and capacity fading of Li-rich Mn-based cathode |
| 网址 | |
| DOI |
10.1016/j.jcis.2024.08.078
doi
|
| 其它 |
期刊:Journal of Colloid and Interface Science 作者:Zhigui Zhang; Pengzu Kou; Yu Chen; Runguo Zheng; Zhiyuan Wang; et al 出版日期:2024-08-13 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)