| 标题 |
Direct Visualization of Charge Migration in Bilayer Tantalum Oxide Films by Multimodal Imaging |
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| DOI | |
| 其它 |
期刊:Advanced electronic materials 作者:Matthew Flynn‐Hepford; John Lasseter; Ivan I. Kravchenko; Steven Randolph; Jong K. Keum; et al 出版日期:2023-11-13 |
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(2025-6-4)