| 标题 |
Morphological Instability of High Ge Percent SiGe Films Grown by Ultra-High Vacuum Chemical Vapor Deposition |
| 网址 | |
| DOI | |
| 其它 |
期刊:ECS Meeting Abstracts 作者:John Hart; Ramsey Hazbun; James Nakos; Dean Siegel; Chris Funch; et al 出版日期:2014 |
| 求助人 | |
| 下载 |
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(2025-6-4)