| 标题 |
Effective thermo-mechanical properties and deformation characteristics of through-glass-via (TGV) structures in microelectronic packaging |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronics Reliability 作者:Ushnik Ghosh; Yu-Lin Shen 出版日期:2026-01-24 |
| 求助人 | |
| 下载 | 暂无链接,等待应助者上传 |
PDF的下载单位、IP信息已删除
(2025-6-4)