| 标题 |
 A CMOS Synchronized Sample-and-Hold Artifact Blanking Analog Front-End Local Field Potential Acquisition Unit With ±3.6-V Stimulation Artifact Tolerance and Monopolar Electrode-Tissue Impedance Measurement Circuit for Closed-Loop Deep Brain Stimulation SoCs |
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| DOI | |
| 其它 |
期刊：IEEE Transactions on Circuits and Systems I: Regular Papers 作者：Chi-Wei Huang; Chin-Kai Lai; Chung-Chih Hung; Chung-Yu Wu; Ming-Dou Ker 出版日期：2023-03-18 |
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