| 标题 |
STT-MRAM cell reliability evaluation under process, voltage and temperature (PVT) variations |
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| 其它 |
期刊:2015 10th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) 作者:Elena I. Vatajelu; Rosa Rodriguez-Montanes; Marco Indaco; Paolo Prinetto; Joan Figueras 出版日期:2015-04-01 |
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(2025-6-4)