| 标题 |
Performance-Limiting Trapping Effects in n-Type Ga 2 O 3 Schottky Barrier Diodes |
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| DOI | |
| 其它 |
期刊:IEEE Transactions on Device and Materials Reliability 作者:Shikha Kumari; Shreesh Singh; Kumar Piyush; P. Vigneshwara Raja 出版日期:2026-03-01 |
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(2025-6-4)