| 标题 |
A material identification method using DOLP curves independent of surface roughness and wavelength |
| 网址 | |
| DOI | |
| 其它 |
期刊:Infrared Physics & Technology 作者:Yanlei Liu; Xuanxuan Wang; Daming Wang; Xusheng Li; Zhiying Chen; Yufang Liu 出版日期:2026 |
| 求助人 | |
| 下载 |
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(2025-6-4)