| 标题 |
Detection of Internal Defects Based on Empirical Mode Decomposition and Wavelets Denoising |
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| DOI | |
| 其它 |
期刊:2021 IEEE Industrial Electronics and Applications Conference (IEACon) 作者:Zhiyuan Cheng; Kaixiong Zhu; Xinghui Li; Xiang Qian 出版日期:2021 |
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(2025-6-4)