| 标题 |
Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 作者:Mark H. Engelhard; Donald R. Baer; Alberto Herrera-Gomez; Peter M. A. Sherwood 出版日期:2020-09-23 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)