| 标题 |
Structure determination of amorphous Ge, GeO2 and GeSe by fourier analysis of extended x-ray absorption fine structure (EXAFS) |
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| DOI | |
| 其它 |
期刊:Journal of Non-Crystalline Solids 作者:Dale E. Sayers; Farrel W. Lytle; Edward A. Stern 出版日期:2003-06-21 |
| 求助人 | |
| 下载 |
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(2025-6-4)