| 标题 |
Application of high-pressure scanning electron microscopy (ECO-SEM) in forensic sample analysis |
| 网址 | |
| DOI | |
| 其它 |
期刊:Proceedings, annual meeting, Electron Microscopy Society of America 作者:Thomas A. Kubic; JoAnn Buscaglia 出版日期:2020-06-18 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)