| 标题 |
Ultra‐Low Power Consumption and Highly Durability in Sm:HfO 2 Thin Film Ferroelectric Memristor for Edge Detection |
| 网址 | |
| DOI | |
| 其它 |
期刊:Advanced electronic materials 作者:Tengyu Li; Yongrui Wang; Wenxiao Zhang; Jikang Xu; Xiaobing Yan 出版日期:2026-02-19 |
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(2025-6-4)