| 标题 |
Characterization of the damage produced by high-energy implantations into silicon by the thermal wave and RBS/channeling techniques |
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| DOI | |
| 其它 |
期刊:Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms 作者:G.S. Sandhu; M. Anjum; S. Cherekdjian; B.K. Patnaik; N.R. Parikh; et al 出版日期:2002-11-12 |
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(2025-6-4)