| 标题 |
Relaxation-free HgCdTe heteroepitaxy via lattice-matching: X-ray reciprocal space mapping characterization and dual-color focal plane array performance validation 基于晶格匹配的无弛豫HgCdTe异质外延:X射线互易空间映射表征和双色焦平面阵列性能验证
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| DOI | |
| 其它 |
期刊:Applied Physics Letters 作者:Jun Li; Gang Qin; Song Geng; Jianyun Yu; Wenbin Qi; et al 出版日期:2025-08-21 |
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