| 标题 |
A New Stitching Method for Dark-Field Surface Defects Inspection Based on Simplified Target-Tracking and Path Correction |
| 网址 | |
| DOI | |
| 其它 |
期刊:Sensors 作者:Xue Chen; Jiaqi Li; Yongxin Sui 出版日期:2020-01-13 |
| 求助人 | |
| 下载 |
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(2025-6-4)