| 标题 |
Comprehensive physics-based RRAM compact model including the effect of variability and multi-level random telegraph noise |
| 网址 | |
| DOI | |
| 其它 |
期刊:Microelectronic Engineering 作者:Tommaso Zanotti; Paolo Pavan; Francesco Maria Puglisi 出版日期:2022-09-27 |
| 求助人 | |
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(2025-6-4)