| 标题 |
Hydrogen Proton Induced HTRB Reliability Degradation in Trench Power Devices |
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| DOI | |
| 其它 |
期刊:2020 4th IEEE Electron Devices Technology & Manufacturing Conference (EDTM) 作者:C. Jacquemont; K. M. Wong; David Goh 出版日期:2020-06-17 |
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(2025-6-4)