Lv11
90 积分 2024-09-06 加入
Study on The Degradations Produced by Different P-base Diffusion Temperatures on SGT MOSFET With Approximate Threshold Voltage
3小时前
已完结
(Invited) Trench-Gated MOSFET Instability Caused by High Temperature Reverse-Bias Stress
3小时前
已关闭
Research on Failure Mechanism of High Temperature Reverse Bias Test for Power VDMOS
3小时前
已关闭
HTRB-Based Assessment of Epoxy Mold Compounds Using a Multi-DUT Monitoring Platform
3小时前
已关闭
Hydrogen Proton Induced HTRB Reliability Degradation in Trench Power Devices
4小时前
已完结
Failure Analysis and Research on Shielded-Gate Trench MOSFET
4小时前
已完结
Wider SOA SGT MOSFET with Self-Adjusting Negative Feedback by Patterning the Varied Resistance of Source
4小时前
已完结
A Method for Improving SOA Performance of SGT MOSFET
4小时前
已完结
Thermal instability failure analysis of Shielded-gate Trench MOSFET in linear mode
4小时前
已完结
Semiconductors: Will the U.S. CHIPS Act Speed the Lab-to-Fab Transition?: A Semiconductor Startup's Journey Shows How It Could Work
17天前
已完结
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