| 标题 |
Monitoring Gate-Source Turn-Off Transients with a Series-Parallel Resonator for Early Detection of Bond-Wire Lift-Off and Gate-Oxide Degradation |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Power Electronics 作者:Keqi Song; Kin Ki Chung; Yangxiao Xiang; Yuanxi Chen; Henry Shu-Hung Chung 出版日期:2026-01-01 |
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(2025-6-4)