| 标题 |
Analysis on the dependence of layout parameters on ESD robustness of CMOS devices for manufacturing in deep-submicron CMOS process |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Semiconductor Manufacturing 作者:Tung-Yang Chen; Ming-Dou Ker 出版日期:2003-08-12 |
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(2025-6-4)