| 标题 |
Effect of Grain Boundary Protrusion on Electrical Performance of Low Temperature Polycrystalline Silicon Thin Film Transistors |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Journal of the Electron Devices Society 作者:Mohammad Masum Billah; Abu Bakar Siddik; Jung Bae Kim; Lai Zhao; Soo Young Choi; et al 出版日期:2019-04-26 |
| 求助人 | |
| 下载 |
PDF的下载单位、IP信息已删除
(2025-6-4)