| 标题 |
 Modulating Competition between Defect Generation and Annihilation in Dielectric Breakdown Showing a Full Range of Reverse, Diminishing, and Forward Area Scaling Trends |
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| DOI | |
| 其它 |
期刊：2025 IEEE International Reliability Physics Symposium (IRPS) 作者：Ernest Wu; Paul Jamison; Steven Consiglio; Takaaki Tsunomura; Takashi Ando 出版日期：2025-05-16 |
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