| 标题 |
Oxygen defect engineering at TMOx (TM = Mn, Co, Fe, Ni, Cu, Zn)/TiO2 interfaces: A strategy for high-efficiency catalytic toluene degradation |
| 网址 | |
| DOI | |
| 其它 |
期刊:Materials Science in Semiconductor Processing 作者:Yaqi Wu; Jianhua Qian; Jinjuan Xing; Junhua Li; He Huang; et al 出版日期:2025-07-17 |
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(2025-6-4)