| 标题 |
Failure Physics and Reliability of GaN‐Based HEMTs for Microwave and Millimeter‐Wave Applications: A Review of Consolidated Data and Recent Results |
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| DOI | |
| 其它 |
期刊:Physica Status Solidi A-applications and Materials Science 作者:Enrico Zanoni; Fabiana Rampazzo; Carlo De Santi; Z. Gao; Chandan Sharma; et al 出版日期:2022-03-25 |
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(2025-6-4)