| 标题 |
A 3 nm IRDS projection based design space variability and experimental feasibility in junctionless forksheet FET: implications for next-generation digital, analog/RF, and circuit applications |
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| DOI | |
| 其它 |
期刊:Solid-State Electronics 作者:Kavya Mulaga; Mohan Siva Kumar Mattaparthi; Ramya Dalai; Sresta Valasa; Venkata Ramakrishna Kotha; et al 出版日期:2025-12-01 |
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(2025-6-4)