| 标题 |
3D Imaging of In-Grown Stacking Faults in n-type 4H-SiC Epilayers Using Time-Resolved Photoluminescence |
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| DOI | |
| 其它 |
期刊:Journal of Physical Chemistry Letters 作者:Zhaoxia Yang; J. Leng; Feng-Ke Sun; Wen-Ming Tian; Sheng-Ye Jin 出版日期:2025-04-09 |
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(2025-6-4)