| 标题 |
A systematic approach for quantitative orientation and phase fraction analysis of thin films through grazing-incidence X-ray diffraction |
| 网址 | |
| DOI |
10.1107/s1600576725004935
doi
|
| 其它 |
期刊:Journal of Applied Crystallography 作者:Fabian Gasser; Sanjay John; Jorid Smets; Josef Simbrunner; Mario Fratschko; et al 出版日期:2025-07-22 |
| 求助人 | |
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(2025-6-4)