| 标题 |
Quantitative in-situ TEM nanotensile testing of single crystal Ni facilitated by a new sample preparation approach |
| 网址 | |
| DOI | |
| 其它 |
期刊:Micron 作者:Vahid Samaeeaghmiyoni; Hosni Idrissi; Jonas Groten; Ruth Schwaiger; Dominique Schryvers 出版日期:2017-03-01 |
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(2025-6-4)