| 标题 |
Reverse breakdown and light-emission patterns studied in Si PureB SPADs |
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| DOI | |
| 其它 |
期刊:2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) 作者:Max Krakers; T. Kneevic; L. K. Nanver 出版日期:2019 |
| 求助人 | |
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(2025-6-4)