| 标题 |
Parametrization of optical properties of indium–tin–oxide thin films by spectroscopic ellipsometry: Substrate interfacial reactivity |
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| DOI | |
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期刊:Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 作者:M. Losurdo; M. Giangregorio; P. Capezzuto; G. Bruno; R. De Rosa; et al 出版日期:2002-07-27 |
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(2025-6-4)