| 标题 |
Damage mapping via electrical impedance tomography in complex AM shapes using mixed smoothness and Bayesian regularization |
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| DOI | |
| 其它 |
期刊:Computer Methods in Applied Mechanics and Engineering 作者:Tyler N. Tallman; Laura Homa; Mark Flores; John Wertz 出版日期:2023-09-01 |
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(2025-6-4)