| 标题 |
Exploiting Oxide Based Resistive RAM Variability for Bayesian Neural Network Hardware Design |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Nanotechnology 作者:Akul Malhotra; Sen Lu; Kezhou Yang; Abhronil Sengupta 出版日期:2020-03-31 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人或该文件上传人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)