| 标题 |
Background-Weaken Generalization Network for Few-Shot Industrial Metal Defect Segmentation |
| 网址 | |
| DOI | |
| 其它 |
期刊:IEEE Transactions on Instrumentation and Measurement 作者:Ruiyun Yu; Haoyuan Li; Bingyang Guo; Ziming Zhao 出版日期:2025 |
| 求助人 | |
| 下载 |
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(2025-6-4)