| 标题 |
Study on the wettability, intermetallic compound growth, voids formation and mechanical properties of Cu/Sn joints with changes in substrate roughness for electronic packaging |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of materials science. Materials in electronics 作者:Y. Hu; Jieshi Chen; Yi Zhen; Yuzhu Han; Chun Yu; et al 出版日期:2025-05-01 |
| 求助人 | |
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(2025-6-4)