| 标题 |
Study of structure and optical properties of silver oxide films by ellipsometry, XRD and XPS methods |
| 网址 | |
| DOI | |
| 其它 |
期刊:Thin Solid Films 作者:Xiaoyong Gao; Songyou Wang; Jing Li; Yu-Xiang Zheng; Rongjun Zhang; et al 出版日期:2004-04-28 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
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(2025-6-4)