| 标题 |
Carrier phase distribution based scan step noise correction for white light interferometry topography measurements |
| 网址 | |
| DOI | |
| 其它 |
期刊:Optics and Lasers in Engineering 作者:Long Ma; Fengyu Yang; Yuan Zhao; Xin Pei; Xutao Yin 出版日期:2023-10-01 |
| 求助人 | |
| 下载 |
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(2025-6-4)