| 标题 |
How to prevent a runaway chemical reaction in the isotropic etching of silicon with HF/HNO 3 /CH 3 COOH or HNA solution |
| 网址 | |
| DOI | |
| 其它 |
期刊:Device and Process Technologies for MEMS, Microelectronics, and Photonics III 作者:Jung-Chih Chiao; Wing C. Hui; Alex J. Hariz; David N. Jamieson; Giacinta Parish; Vijay K. Varadan 出版日期:2004 |
| 求助人 | |
| 下载 |
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(2025-6-4)