| 标题 |
Comparison of Tin and Indium Thin Film’s Structural, Morphological, Adhesion, and Electrical Properties for Ohmic Contact in HgCdTe-Based Infrared Detectors |
| 网址 | |
| DOI | |
| 其它 |
期刊:Journal of Materials Engineering and Performance 作者:Shailendra Kumar Gaur; Qasim Murtaza; R. S. Mishra 出版日期:2024 |
| 求助人 | |
| 下载 | 求助已完成,仅限求助人下载。 |
PDF的下载单位、IP信息已删除
(2025-6-4)