| 标题 |
Electromigration Performance of Fine-Line Cu Redistribution Layer (RDL) for High-Density Fan-Out Packaging |
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| DOI | |
| 其它 |
期刊:2023 IEEE 73rd Electronic Components and Technology Conference (ECTC) 作者:JiHye Kwon; JeongMin Ju; SangHyuk Kim; EunSook Sohn; JinYoung Khim 出版日期:2023-05-01 |
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(2025-6-4)